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Terrestrial Neutron-induced Soft Error In Advanced Memory Devices
Terrestrial neutron-induced soft errors of semiconductor memory devices are a major concern in reliability issues. Understanding the mechanism and quantifying soft-error rates are primarily crucial for the design and quality assurance of semiconductor memory devices. Les mer
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Terrestrial neutron-induced soft errors of semiconductor memory devices are a major concern in reliability issues. Understanding the mechanism and quantifying soft-error rates are primarily crucial for the design and quality assurance of semiconductor memory devices. This book covers the relevant topics in terrestrial neutron-induced soft errors.
Detaljer
- Forlag
- World Scientific Publishing Co Pte Ltd
- Innbinding
- Innbundet
- Språk
- Engelsk
- ISBN
- 9789812778819
- Utgivelsesår
- 2008
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